Semiconductor Devices
Semiconductor physics, PN junctions and every diode family, BJTs, JFETs, MOS capacitors, MOSFETs, CMOS, FinFET/GAA, power devices (IGBT, thyristors, SiC, GaN), RF and optoelectronic devices, sensors, memory and emerging devices, fabrication and packaging, reliability, characterization, SPICE models and device selection — the physics behind every chip in every other track on this page.
Semiconductor Fundamentals
- Semiconductor Materials: Conductors, Semiconductors & Insulators
- Atomic & Crystal Structure of Semiconductors
- Energy Bands, Bandgap & Band Diagrams
- Intrinsic & Extrinsic Semiconductors: Doping and Carrier Concentration
Carrier Statistics, Transport & Recombination
- Carrier Statistics: Fermi-Dirac, Density of States & Fermi Level
- Carrier Transport: Drift, Diffusion, Mobility & Conductivity
- Generation, Recombination & Carrier Lifetime
- Semiconductor Equations: Poisson, Continuity & Drift-Diffusion
PN Junctions & Diodes
- PN Junction Electrostatics: Built-in Potential, Depletion & Fields
- PN Junction Under Bias & the Diode Equation
- Junction Capacitance, Switching & Breakdown
- Metal–Semiconductor Contacts & Schottky Diodes
- Zener, Schottky, TVS & Other Special-Purpose Diodes
- Diode Families: Rectifier, Fast-Recovery, PIN, Varactor, Tunnel & TVS
- Rectifiers & Capacitor-Input Filters
Bipolar & Junction-Gate Transistors
- BJT Physics: Injection Efficiency, Base Transport & the Gummel Plot
- BJT Models (Ebers-Moll, Gummel-Poon) & Switching
- JFET Physics: Channel, Pinch-off & the Shockley Equation
MOS Devices, CMOS & Advanced Transistors
- The MOS Capacitor: Accumulation, Depletion, Inversion & C–V
- MOSFET Operation: Threshold, Regions, Body Effect & Subthreshold
- MOSFET Capacitances, Gate Charge & Switching
- Short-Channel & Advanced MOSFET Effects
- CMOS Devices: Inverter, Power, Delay & Scaling
- FinFET, Gate-All-Around & SOI Transistors
Power Semiconductor Devices
- Power Semiconductor Fundamentals & Power Diodes
- Power MOSFETs & IGBTs
- Thyristor Family: SCR, TRIAC, DIAC, GTO & IGCT
- Wide-Bandgap Power Devices: SiC & GaN
RF, Optoelectronic & Sensor Devices
- Heterostructures, HEMTs, HBTs & Microwave Devices
- LEDs, Laser Diodes & VCSELs
- Photodiodes, APDs, Phototransistors & Solar Cells
- Semiconductor Sensors & Hall-Effect Devices
Memory, Emerging Devices & Radiation Effects
- Semiconductor Memory: SRAM, DRAM, ROM, EEPROM & Flash
- SRAM & Memory Design
- Non-Volatile Memory Physics: Floating Gate, Charge Trap & Tunnelling
- Emerging Devices: TFETs, 2-D FETs, ReRAM, PCM, MRAM & Neuromorphic
- Radiation Effects in Semiconductor Devices
Fabrication, Packaging & Thermal
- Silicon Crystal Growth, Wafers & Epitaxy
- Oxidation & Photolithography
- Etching, Ion Implantation, Diffusion & Annealing
- Deposition, Metallization & Interconnect
- IC Fabrication Process
- CMOS Process Flow, Advanced CMOS & Yield
- Packaging, Advanced Packaging & Thermal Path
- Thermal Design, Heatsinks & Safe Operating Area
Reliability, Characterization & Modelling
- Semiconductor Reliability Physics & Qualification
- Failure Analysis, ESD Handling & Lab Safety
- Device Characterization: I–V, C–V & Parameter Extraction
- SPICE Semiconductor Models & Simulation
Device Selection & Applications
- Datasheets, Device Selection & Device Debugging
- Automotive & EV Semiconductor Devices
- Semiconductor Devices in Analog, Digital, Power & Communication Systems