JFET Physics: Channel, Pinch-off & the Shockley Equation
The junction field-effect transistor from the inside. Learn N- and P-channel construction, the gate PN junction controlling channel thickness, depletion from gate voltage and drain voltage, pinch-off and current saturation, the internal pinch-off voltage V_P0 = qN_Da²/(2ε), V_GS(off), I_DSS and open-channel conductance, the Shockley square-law approximation, output and transfer characteristics, small-signal g_m, r_o and capacitances, low-noise and high-input-impedance properties, temperature behaviour (zero-TC point) and applications — with Python deriving pinch-off voltage, I_DSS, I_D and g_m from doping and geometry.
A JFET is a doped semiconductor bar whose cross-section is squeezed by reverse-biased gate junctions. More reverse gate voltage → wider depletion → narrower channel → less current. It is a normally-on, voltage-controlled resistor and current source.
Its gate is a reverse-biased junction (pA leakage) and its channel has no oxide interface — making JFETs exceptionally quiet at low frequencies, prized in audio and instrumentation.
An analogy
A JFET is a garden hose with a clamp: the gate voltage tightens the clamp (depletion), the water flow (drain current) drops, and eventually the hose is pinched shut. Pushing harder at the tap (drain voltage) also narrows the downstream end — the flow saturates.
Operation
At V_GS = 0 the channel is open (depletion-mode, normally on). Making V_GS negative (N-channel) widens the gate depletion regions and increases channel resistance. At V_GS = V_P the channel closes completely. For V_DS beyond V_GS − V_P, the channel pinches off at the drain end and I_D saturates.
Characteristics and parameters
Datasheet essentials:
- I_DSS — wide spread (e.g. 2–20 mA within one part number): sort or bias robustly
- V_GS(off) — correlated with I_DSS
- g_m, g_os (1/r_o), C_iss, C_rss
- Gate leakage I_GSS — pA at 25 °C, doubles every ~10 °C
- Noise e_n (nV/√Hz) and very low 1/f corner
- Forward-biasing the gate (> ~0.5 V) destroys the high input impedance
Temperature and zero-TC bias
Mobility falls with temperature (I_D decreases) while V_P magnitude increases slightly (I_D increases); at one bias point near V_GS ≈ V_P + 0.63 V the effects cancel — the zero-temperature-coefficient point used in stable current sources. JFETs also make simple two-terminal current regulators (gate tied to source).
Variants
MESFETs replace the PN gate with a Schottky gate (GaAs RF amplifiers), and SiC JFETs serve as rugged power switches (normally-on, often cascoded with a low-voltage MOSFET to make a normally-off 'SiC cascode'). JFET-input op-amps combine JFET inputs with bipolar gain stages.
Formulas
- Internal pinch-off:
V_P0 = qN_Da²/(2ε_s); V_P = V_bi − V_P0 - Open-channel conductance:
G₀ = qN_Dµ_n·2aZ/L - I_DSS (full model):
I_DSS ≈ G₀V_P0/3 (neglecting V_bi) - Shockley (square law):
I_D = I_DSS(1 − V_GS/V_P)² - Transconductance:
g_m = (2I_DSS/|V_P|)(1 − V_GS/V_P) = 2√(I_DSS I_D)/|V_P|
Worked example: Drain current
Given: I_DSS 12 mA, V_P −3 V, V_GS −1.5 V
Find: I_D.
- 12 × (0.5)²
Answer: 3 mA
Worked example: Transconductance
Given: Same bias
Find: g_m.
- 2√(12 × 3)/3 mS
Answer: 4 mS
Worked example: Pinch-off
Given: N_D 5 × 10¹⁵, a 1.5 µm
Find: V_P0.
- qN_Da²/2ε = 1.602e−19 × 5e15 × 2.25e−8/2.072e−12
Answer: ≈ 8.7 V
N-channel JFET cross-section
Gate (p⁺)
─────┬─────────────┬─────
S ═══ │▒▒ depletion ▒│ ═══ D V_DS > 0: depletion wider near drain (more reverse bias)
│ n channel ─► │ Pinch-off when depletion meets at the drain end
─────┴─────────────┴───── V_DS(sat) = V_GS − V_P
Gate (p⁺, tied)The gate junctions deplete the channel from both sides. With drain voltage the channel potential rises toward the drain, so depletion is wedge-shaped. When the wedges touch at the drain end the channel pinches off; further V_DS drops across the pinched region and the current saturates.
Pinch-off, I_DSS and the transfer curve from physics
import math
# JFET from physics: pinch-off voltage from channel doping and thickness, IDSS, Shockley curve, gm
q, eps = 1.602e-19, 11.7 * 8.854e-14
Nd, a = 1e16, 1.0e-4 # channel doping, half-thickness 1 um
Vp0 = q * Nd * a**2 / (2 * eps) # internal pinch-off voltage
Vbi = 0.8
Vp = Vbi - Vp0
print(f"internal pinch-off {Vp0:.2f} V -> VGS(off) = Vbi - Vp0 = {Vp:.2f} V")
mu, Z, L = 1100.0, 1000e-4, 10e-4 # mobility, width 1 mm, length 10 um
G0 = q * Nd * mu * 2 * a * Z / L
print(f"open-channel conductance G0 = {G0*1e3:.2f} mS (R0 = {1/G0:.0f} ohm)")
IDSS = G0 * Vp0 / 3 # square-law approximation of the full Shockley model
print(f"IDSS ~ G0*Vp0/3 = {IDSS*1e3:.1f} mA")
for VGS in (0, -1, -2, -3):
ID = IDSS * (1 - VGS / Vp) ** 2 if VGS > Vp else 0
gm = 2 * IDSS / abs(Vp) * (1 - VGS / Vp) if VGS > Vp else 0
print(f"VGS = {VGS:2d} V: ID = {ID*1e3:6.2f} mA, gm = {gm*1e3:.2f} mS")
# internal pinch-off 7.73 V -> VGS(off) = Vbi - Vp0 = -6.93 V
# open-channel conductance G0 = 35.24 mS (R0 = 28 ohm)
# IDSS ~ G0*Vp0/3 = 90.8 mA
# VGS = 0 V: ID = 90.84 mA, gm = 26.21 mS
# VGS = -1 V: ID = 66.52 mA, gm = 22.43 mS
# VGS = -2 V: ID = 45.98 mA, gm = 18.65 mS
# VGS = -3 V: ID = 29.23 mA, gm = 14.87 mSA 1 µm half-thickness channel doped 10¹⁶ gives an internal pinch-off of 7.7 V and a gate cut-off near −6.9 V. A 1 mm-wide, 10 µm-long channel conducts 35 mS when open, giving I_DSS ≈ 91 mA — a power-class JFET. Small-signal JFETs use thinner, narrower channels (I_DSS of a few mA, V_P of −0.5 to −4 V).
Common mistakes
- Wrong: Designing for the typical I_DSS. — Right: Use self-bias/feedback: I_DSS spreads 5–10×.
- Wrong: Forward-biasing the gate. — Right: Gate becomes a diode — high input impedance lost.
- Wrong: Treating JFETs as enhancement devices. — Right: They are normally on.
Applications
- Low-noise preamps: Microphones, hydrophones, electrometers.
- Current regulators: Gate-source shorted JFET diodes.
- Analog switches/VCRs: Voltage-controlled resistors.
- SiC power JFETs: Cascode power switches.
Key takeaways
- Gate junction depletion controls channel thickness.
- V_P0 = qN_Da²/2ε; I_D = I_DSS(1 − V_GS/V_P)².
- Normally on, very low noise, pA gate current.
- Design for wide I_DSS/V_P spread.
Going further
- Velocity-saturated JFET/MESFET: Short-gate models.
- SiC cascodes: Normally-off power switches.
- Noise models: Gate current shot noise, channel thermal noise.